Design Application of Deep Convolutional Neural Network for Vision-Based Defect Inspection,

Fusaomi Nagata, Kenta Tokuno, Keigo Watanabe, Maki K. Habib,

Procs. of 2018 IEEE International Conference on Systems, Man, and Cybernetics,

2018/10

pp. 1701

～

1706,

口頭、IEEE Explore (オンライン),　USBメモリ