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| 基本情報 |
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| 氏名 |
永田 寅臣 |
| 氏名（カナ） |
ナガタ フサオミ |
| 氏名（英語） |
NAGATA Fusaomi |
A Simple Method to Improve Contrastive Learning for Defect Recognition with a Small Dataset
Procs. of 16th IIAI International Congress on Advanced Applied Informatics
International Institute of Applied Informatics
International Institute of Applied Informatics
H. Kato, F. Nagata, A Simple Method to Improve Contrastive Learning for Defect Recognition with a Small Dataset, Procs. of 16th IIAI International Congress on Advanced Applied Informatics, pp. 249-252, July 6-12, 2024, Takamatsu, Japan.
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