Comparison of thermal properties between Si and SiC power MOSFET using electro-thermal analysis

R. Kibushi,T. Hatakeyama,K. Yuki,N. Unno,M. Ishizuka

Proceedings of 2017 International Conference on Electronics Packaging, ICEP 2017

2017/04

188

～

192

研究論文（国際会議プロシーディングス）