Comparison of hot spot temperature between Si and SiC power MOSFET using electro-thermal analysis

Risako Kibushi,Tomoyuki Hatakeyama,Kazuhisa Yuki,Noriyuki Unno,Masaru Ishizuka

Proceedings of the 16th InterSociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, ITherm

2017/07

921

～

925

研究論文（国際会議プロシーディングス）