A Simple Method to Improve Contrastive Learning for Defect Recognition with a Small Dataset

Hirohisa Kato, Fusaomi Nagata

Proceedings of 2024 16th IIAI International Congress on Advanced Applied Informatics (IIAI-AAI)

2024/07

249

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252

International Institute of Applied Informatics

International Institute of Applied Informatics

オンライン，口頭