Curved Surface Fitting Method Using a Raster-Scanning Window and Its Application to Stereolithography-Based Reverse Engineering

Fusaomi Nagata, Norifumi Horie, Hiroaki Ochi, Keigo Watanabe, Maki K. Habib

Procs. of the 43th Annual Conference of the IEEE Industrial Electronics Society (IECON 2017), China National Convention Center, Beijing, China

2017-10

pp. 6258

ENG

6263

IEEE

IEEE

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