Basic Application of Deep Convolutional Neural Network to Visual Inspection,

Fusaomi Nagata, Kenta Tokuno, Hisami Tamano (Mitsubishi Pencil Co. Ltd.), Hitoshi Nakamura (Mitsubishi Pencil Co. Ltd.), Makoto Tamura (Mitsubishi Pencil Co. Ltd.), Kenjiro Kato (Mitsubishi Pencil Co. Ltd.), Akimasa Otsuka, Takeshi Ikeda, Keigo Watanabe (Okayama Univ.), Maki K. Habib (American University in Cairo),

Procs. of International Conference on Industrial Application Engineering (ICIAE2018),

2018-03-28

pp. 4

ENG

8

口頭発表, 誌上発表（Proceedings）