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Basic information |
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Defect detection method using deep convolutional neural network, support vector machine and template matching techniques
Fusaomi Nagata, Kenta Tokuno, Kazuki Mitarai, Akimasa Otsuka, Takeshi Ikeda, Hiroaki Ochi, Keigo Watanabe, Maki K. Habib
Artificial Life and Robotics, Springer
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