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Defect Detection and Visualization of Understanding Using Fully Convolutional Data Description Models
F. Nagata, S. Sakata, H. Kato, K. Watanabe, M.K. Habib
Procs. of 16th IIAI International Congress on Advanced Applied Informatics
International Institute of Applied Informatics
International Institute of Applied Informatics
F. Nagata, S. Sakata (M1), H. Kato, K. Watanabe, M.K. Habib, Defect Detection and Visualization of Understanding Using Fully Convolutional Data Description Models, Procs. of 16th IIAI International Congress on Advanced Applied Informatics, pp. 78-83, July 6-12, 2024, Takamatsu, Japan.
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