著作(論文等)
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Comparison of thermal properties between Si and SiC power MOSFET using electro-thermal analysis
R. Kibushi,T. Hatakeyama,K. Yuki,N. Unno,M. Ishizuka
Proceedings of 2017 International Conference on Electronics Packaging, ICEP 2017
2017-04
188
ENG
192
研究論文（国際会議プロシーディングス）
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