著作(論文等)
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Design Application of Deep Convolutional Neural Network for Vision-Based Defect Inspection,
Fusaomi Nagata, Kenta Tokuno, Keigo Watanabe, Maki K. Habib,
Procs. of 2018 IEEE International Conference on Systems, Man, and Cybernetics,
2018-10
pp. 1701
ENG
1706,
口頭、IEEE Explore (オンライン), USBメモリ
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