著作(論文等)
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A Simple Method to Improve Contrastive Learning for Defect Recognition with a Small Dataset
Hirohisa Kato, Fusaomi Nagata
Proceedings of 2024 16th IIAI International Congress on Advanced Applied Informatics (IIAI-AAI)
2024-07
249
ENG
252
International Institute of Applied Informatics
International Institute of Applied Informatics
オンライン，口頭
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